Pickering Interfaces to showcase semiconductor testing solutions at Microelectronics UK

Pickering Interfaces will present its modular signal switching solutions for semiconductor test and verification at the Microelectronics UK event. The exhibition will take place from September 29–30 at Excel London.

The company will showcase various technologies, including high-density matrix switching, LXI reed relay plug-in matrices, and high-crosspoint density PXI matrices. These tools are designed for applications such as wafer acceptance testing, photonics testing, and high pin-count package validation.

Additionally, Pickering will feature its Test System Architect, a recently launched graphical design tool intended to simplify the design of signal switching and cabling systems. The company's solutions aim to provide precise signal routing and low leakage for complex test environments.