Teradyne announces Magnum E2 for next-generation memory testing

Teradyne has announced the Magnum E2, a high-speed memory test system designed for next-generation DRAM and NAND flash. The system is built to support advanced interfaces including LPDDR6, DDR6, and GDDR7, addressing the increasing complexity of mass production testing for AI and High-Performance Computing (HPC) memory.

The Magnum E2 utilizes a Near-DUT Test (NDT) architecture to minimize signal quality degradation by placing digital measurement circuits close to the device under test. It supports multiple signaling methods such as NRZ, PAM3, and PAM4. The platform is designed to be scalable, allowing users to transition between current and future memory standards without replacing hardware, and integrates logic testing capabilities to streamline the testing of fused memory and logic devices.