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[SITUATION] · [ACTIVE] · [TECHNOLOGY]
2 clusters · 4 sources · 8 days · First seen · Last updated
Teradyne AI semiconductor testing expansion
Overview
Teradyne has introduced three new instruments for its UltraFLEXplus automated test equipment platform to address the growing complexities of AI and data center semiconductor testing.
The new hardware includes the UltraPin5000-EM, which provides higher vector memory and faster pattern loading for pattern-intensive compute chips; the UltraPort-PCIe6, which supports PCIe 6.0 interfaces with 64Gbps speeds; and the UltraVS64-HP, a high-power supply instrument capable of delivering up to 1,280 A per unit, or up to 5,120 A when multiple units are connected.
These advancements are intended to manage rising power densities, increased circuit scale, and higher I/O speeds, ultimately aiming to improve test time, yield, and efficiency for high-value AI devices and advanced packaging.
Entities
Teradyne · HDMI · UltraFLEXplus · Tektronix · TekExpress
Timeline
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4 days ago
[TECHNOLOGY] 2 sourcesTeradyne expands UltraFLEXplus testing for AI semiconductorsTeradyne has launched three new instruments for its UltraFLEXplus platform to enhance testing for AI and data center semiconductors, focusing on high-speed I/O and high-power requirements.
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12 days ago
[TECHNOLOGY] 2 sourcesTeradyne launches new testing instruments for AI and data center chipsTeradyne has launched new UltraFLEXplus testing instruments to meet the complex demands of AI and data center chips, while designers increasingly use modular hardware to accelerate AI system integration.
Sources
electronicsforu.com · global-net.co.jp · powerelectronics.com · prtimes.jp